Matthew Jerry (Notre Dame) wins TECHCON 2017 Best in Session Award

Author: Barbara Walsh

Matt JerryMatt Jerry

Semiconductor Research Corporation students, industry, and faculty members recently attended TECHCON 2017. TECHCON is a Technical conference and networking event, held on September 10-12 at the Renaissance Austin Hotel in Austin, TX. Congratulations go to EXCEL PhD student Matthew Jerry, as he won a "Best in Session" award for the session: Security: PUFs, RNGS and Attacks, his paper: "A Random Number Generator based on Stochastic Insulator-to-Metal Phase Transitions."